In Situ Drift Compensation in the Scanning Transmission Electron Microscope with Subatomic Bond Length Precision
Invention type: Technology
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Case number: #25243J
Researchers
Julian Klein
/ Frances Ross
/ Kevin Roccapriore
Departments: Department of Materials Science and Engineering
Technology Areas: Sensing & Imaging: Imaging
Impact Areas: Advanced Materials
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real-time, rapid, and non-invasive "atomic lock-on" in the scanning transmission electron microscope with picometer precision
United States of America | Pending
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