In Situ Drift Compensation in the Scanning Transmission Electron Microscope with Subatomic Bond Length Precision

Researchers

Julian Klein / Frances Ross / Kevin Roccapriore

Departments: Department of Materials Science and Engineering
Technology Areas: Sensing & Imaging: Imaging
Impact Areas: Advanced Materials

  • real-time, rapid, and non-invasive "atomic lock-on" in the scanning transmission electron microscope with picometer precision
    United States of America | Pending

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