Automated Optical Measurements to Determine Semiconductor Properties and Predict Device Performance

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An example methodology implementing the disclosed techniques includes receiving a plurality of measured semiconductor properties of one or more partially completed semiconductor devices, determining a measure of short circuit current density (JSC) of each of the one or more partially completed semiconductor devices, the JSC, measure based on a measure of semiconductor diffusion length (LD) and a measure of thickness, and determining a current voltage relationship of each of the one or more partially completed semiconductor devices.

Researchers

Vladimir Bulovic / Anthony Troupe / Brandon Motes / Dane de Quilettes

Departments: Office of the Vice President for Research
Technology Areas: Artificial Intelligence (AI) and Machine Learning (ML) / Electronics & Photonics: Photonics, Semiconductors / Industrial Engineering & Automation: Manufacturing & Equipment / Sensing & Imaging: Imaging

  • prediction of semiconductor device performance
    United States of America | Published application
  • prediction of semiconductor device performance
    European Patent Convention | Published application

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