Automated Optical Measurements to Determine Semiconductor Properties and Predict Device Performance
Exclusively Licensed
Invention type: Technology
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Case number: #22605
An example methodology implementing the disclosed techniques includes receiving a plurality of measured semiconductor properties of one or more partially completed semiconductor devices, determining a measure of short circuit current density (JSC) of each of the one or more partially completed semiconductor devices, the JSC, measure based on a measure of semiconductor diffusion length (LD) and a measure of thickness, and determining a current voltage relationship of each of the one or more partially completed semiconductor devices.
Researchers
Vladimir Bulovic
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Anthony Troupe
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Brandon Motes
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Dane de Quilettes
Departments: Office of the Vice President for Research
Technology Areas: Artificial Intelligence (AI) and Machine Learning (ML) / Electronics & Photonics: Photonics, Semiconductors / Industrial Engineering & Automation: Manufacturing & Equipment / Sensing & Imaging: Imaging
Impact Areas: Connected World, Advanced Materials
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prediction of semiconductor device performance
United States of America | Published application -
prediction of semiconductor device performance
European Patent Convention | Published application
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