Automated Optical Measurements to Determine Semiconductor Properties and Predict Device Performance
An example methodology implementing the disclosed techniques includes receiving a plurality of measured semiconductor properties of one or more partially completed semiconductor devices, determining a measure of short circuit current density (JSC) of each of the one or more partially completed semiconductor devices, the JSC, measure based on a measure of semiconductor diffusion length (LD) and a measure of thickness, and determining a current voltage relationship of each of the one or more partially completed semiconductor devices.
Researchers
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prediction of semiconductor device performance
United States of America | Published application -
prediction of semiconductor device performance
European Patent Convention | Published application
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