High-Throughput Raman Microscopy by Total Internal Reflection

Researchers

Peter So / Koseki Kobayashi-Kirschvink / Jeon Woong Kang

Departments: Department of Mechanical Engineering
Technology Areas: Diagnostics: Assays / Sensing & Imaging: Imaging, Optical Sensing

  • high-throughput raman microscopy by total internal reflection
    United States of America | Pending

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