Dual-Gate Normally-Off Nitride Transistors
Exclusively Licensed
Invention type: Technology
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Case number: #14135
A dual-gate normally-off nitride transistor that includes a first gate structure formed between a source electrode and a drain electrode for controlling a normally-off channel region of the dual-gate normally-off nitride transistor. A second gate structure is formed between the first gate structure and the drain electrode for modulating a normally-on channel region underneath the second gate structure. The magnitude of the threshold voltage of the second gate structure is smaller than the drain breakdown of the first gate structure for proper operation of the dual-gate normally-off nitride transistor.
Researchers
Tomas Palacios
/
Bin Lu
Departments: Dept of Electrical Engineering & Computer Science
Technology Areas: Electronics & Photonics: Quantum Technology, Semiconductors / Industrial Engineering & Automation: Manufacturing & Equipment
Impact Areas: Connected World
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dual-gate normally-off nitride transistors
United States of America | Granted | 8,587,031
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