Nanocrystal Based Three Dimensional Tracking Method with Nanometer Spatial Resolution
Exclusively Licensed
Invention type: Technology
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Case number: #12883
A method of imaging microscopic objects includes determining the relative depths of two or more semiconductor nanocrystals by analyzing images of the semiconductor nanocrystals at varying z-displacements.
Researchers
Moungi G Bawendi
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Hao Huang
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Yu Yao
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C Forbes Dewey
Departments: Department of Chemistry, Department of Mechanical Engineering
Technology Areas: Chemicals & Materials: Nanotechnology & Nanomaterials / Electronics & Photonics: Semiconductors / Sensing & Imaging: Imaging, Optical Sensing
Impact Areas: Advanced Materials
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high-resolution 3d imaging of single semiconductor nanocrystals
United Kingdom | Granted | 2,193,468 -
high-resolution 3d imaging of single semiconductor nanocrystals
United States of America | Granted | 8,947,516 -
high-resolution 3d imaging of single semiconductor nanocrystals
European Patent Convention | Granted | 2,193,468 -
high-resolution 3d imaging of single semiconductor nanocrystals
France | Granted | 2,193,468 -
high-resolution 3d imaging of single semiconductor nanocrystals
Germany | Granted | 2,193,468
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