Nanocrystal Based Three Dimensional Tracking Method with Nanometer Spatial Resolution

Exclusively Licensed

A method of imaging microscopic objects includes determining the relative depths of two or more semiconductor nanocrystals by analyzing images of the semiconductor nanocrystals at varying z-displacements.

Researchers

Moungi G Bawendi / Hao Huang / Yu Yao / C Forbes Dewey

Departments: Department of Chemistry, Department of Mechanical Engineering
Technology Areas: Chemicals & Materials: Nanotechnology & Nanomaterials / Electronics & Photonics: Semiconductors / Sensing & Imaging: Imaging, Optical Sensing
Impact Areas: Advanced Materials

  • high-resolution 3d imaging of single semiconductor nanocrystals
    United Kingdom | Granted | 2,193,468
  • high-resolution 3d imaging of single semiconductor nanocrystals
    United States of America | Granted | 8,947,516
  • high-resolution 3d imaging of single semiconductor nanocrystals
    European Patent Convention | Granted | 2,193,468
  • high-resolution 3d imaging of single semiconductor nanocrystals
    France | Granted | 2,193,468
  • high-resolution 3d imaging of single semiconductor nanocrystals
    Germany | Granted | 2,193,468

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