Header and Body 2

Problem Addressed

Scanning Probe Microscopy (SPM) technology creates images of surfaces through use of a probe that scans a specimen, such as a semiconductor wafer or a biological sample. To craft a specimen image, SPM involves (a) mechanical movement of the probe to scan the specimen and (b) recording techniques to log probe-surface interaction as a function of position. Scanning a surface through conventional SPM methods, i.e. with AFM, can take a considerable amount of time to achieve high resolution levels.