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Problem Addressed

Nano-scale electromechanical (NEM) switches have emerged as a promising alternative to CMOS switching transistor technology. These switches exhibit large on-off current ratio, near-zero off state leakage current, and power efficient operation. However, the required actuation voltage for the current NEM switches is large. Moreover, these switches have low operational reliability due to the effect of static friction that results in frequent irreversible adhesion between the switch terminals.